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1

Spectroscopic ellipsometry of very thin tantalum pentoxide on Si

I. Karmakov, A. Konova, E. Atanassova, A. Paskaleva

Journal:

Applied Surface Science

Year:

2009

Language:

english

File:

PDF, 385 KB

english, 2009

2

Damage depth profiles of shallow-implanted or compositional-graded surfaces for X-ray and γ-ray detectors

A Konova, D Tonova, J Karmakov

Journal:

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Year:

1996

Language:

english

File:

PDF, 456 KB

english, 1996

3

Depth profile characterization of low-energy B+- and Ge+-ion-implanted Si

Iordan Karmakov, Ivan Chakarov, Anka Konova

Journal:

Applied Surface Science

Year:

2003

Language:

english

File:

PDF, 226 KB

english, 2003

4

Spectroscopic Ellipsometry as a Tool for Damage Profiling in Very Shallow Implanted Silicon

Iordan Karmakov, Anka Konova, Ivan Chakarov

Journal:

Plasma Processes and Polymers

Year:

2006

Language:

english

File:

PDF, 233 KB

english, 2006

5

Interfacial layers in Ta2O5 based stacks and constituent depth profiles by spectroscopic ellipsometry

Y. Karmakov, A. Paskaleva, E. Atanassova

Journal:

Applied Surface Science

Year:

2012

Language:

english

File:

PDF, 431 KB

english, 2012

6

Wetting or non-wetting liquid?

Karmakov, Iordan

Journal:

Physics Education

Year:

2000

Language:

english

File:

PDF, 74 KB

english, 2000

7

Influence of Hf doping on interfacial layers of Ta2O5 stacks studied by ellipsometry

Karmakov, Y., Paskaleva, A.

Journal:

Applied Surface Science

Year:

2013

Language:

english

File:

PDF, 816 KB

english, 2013

8

[IEEE 2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC) - Dresden, Germany (2008.10.19-2008.10.25)] 2008 IEEE Nuclear Science Symposium Conference Record - Determination of compositional profiles and thicknesses of the etched surface of CdTe and Cd0.9Zn0.1Te by spectroscopic ellipsometry

Karmakov, I. E., Konova, A. A.

Year:

2008

Language:

english

File:

PDF, 1.52 MB

english, 2008

9

Effect of Sb in thick InGaAsSbN layers grown by liquid phase epitaxy

Donchev, V., Milanova, M., Asenova, I., Shtinkov, N., Alonso-Álvarez, D., Mellor, A., Karmakov, Y., Georgiev, S., Ekins-Daukes, N.

Journal:

Journal of Crystal Growth

Year:

2017

Language:

english

File:

PDF, 981 KB

english, 2017

10

Corrigendum to “Effect of Sb in thick InGaAsSbN layers grown by liquid phase epitaxy” [J. Cryst. Growth 483 (2018) 140–146]

Donchev, V., Milanova, M., Asenova, I., Shtinkov, N., Alonso-Álvarez, D., Mellor, A., Karmakov, Y., Georgiev, S., Ekins-Daukes, N.

Journal:

Journal of Crystal Growth

Year:

2018

Language:

english

File:

PDF, 167 KB

english, 2018

11

Numerical analysis of the delamination in CFRP laminates: VCCT and XFEM assessment

Karmakov, S., Cepero-MejÃas, F., Curiel-Sosa, J.L.

Journal:

Composites Part C: Open Access

Year:

2020

File:

PDF, 2.43 MB

2020

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